Designed for the Analysis of Bulk Materials and Coatings
The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings. Designed for fast and cost-efficient operation it provides accurate information on the elemental composition of materials.
The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and even more important – nondestructively. Samples sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even more comfort.
The M1 MISTRAL as a spectrometer for the accurate analysis of bulk and coating samples using small spot X-ray fluorescence analysis (Micro-XRF). Operating in ambient air, all elements from titanium (Z=22) upwards can be analyzed. This enables the analysis of a wide range of different sample categories, including metals, alloys and metallic multi-layer systems.
Even large samples with sizes up to 100x100x100 mm³ can be analyzed. Excitation and fluorescence radiation detection takes place from above, without sample contact. This allows measurement on differently shaped samples, from flat surfaces of some GMF products to the most intricately shaped piece of jewelry.
The M1 MISTRAL is equipped with a high brilliance micro-focus X-ray tube, which is capable of producing a high excitation intensity, even if the smallest available collimator is used to produce a spot size of a mere 100 µm. Measurement locations can be pinpointed exactly, using the combination of video microscope and the optional motorized X-Y-Z stage.
The M1 MISTRAL is equipped with a large active area silicon drift detector (SDD) for superior speed and energy resolution. The design of the detection and signal processing system warrants maximum efficiency and fast analysis speed.
The XSpect/XData software suite provides a measurement management from spectra acquisition, via evaluation to reporting. Its tools support the analysis of bulk samples and coatings, using either standard-based quantification or a standardless Fundamental Parameter model. Reliable results can be obtained easily and routine measurements can be stored for automated reuse.
Both the software and the M1 MISTRAL itself are designed for use by personnel that may only have received introductory training to the system. Two power outlets are all that is required to run the system. Consumables are not needed, as air-cooling is sufficient.
Ý kiến bạn đọc