JSM-7800FPRIME Schottky Field Emission Scanning Electron Microscope
Mã sản phẩm: S000104
Đăng ngày 27-03-2019 02:27:42 AM

JSM-7800FPRIME delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.

JSM-7800F Schottky Field Emission Scanning Electron Microscope
Mã sản phẩm: S000103
Đăng ngày 27-03-2019 02:26:51 AM

The newly-developed Super Hybrid Lens (SHL) is used to achieve the next-generation high-resolution SEM, without sacrificing operability. The adoption of the Schottky type electron gun delivers stable analysis with large probe current.

JSM-7200F Schottky Field Emission Scanning Electron Microscope
Mã sản phẩm: S000102
Đăng ngày 27-03-2019 02:25:55 AM

JSM-7200F has much higher spatial resolution than the conventional models at both high and low accelerating voltages by applying the technology used for “In-Lens SchottkyPlus”, the electron optics equipped on our flagship-model, JSM-7800FPRIME, and by incorporating TTLS (Through-The-Lens System). The maximum probe current of 300 nA is also guaranteed because of the above mentioned features. Thus, JSM-7200F is a next-generation multi-purpose FE-SEM that has capability of high resolution observation, high throughput analysis, ease of use, and expandability.

JSM-IT500HR InTouchScope™ Scanning Electron Microscope
Mã sản phẩm: S000101
Đăng ngày 27-03-2019 02:24:33 AM

Introducing a new addition to our JEOL InTouchScope™ series SEMs, the JSM-IT500HR.
Increase your productivity with our fully-integrated software, from specimen navigation to analysis to report creation.
This state-of-the-art SEM, with its high-brightness electron gun system, provides amazing high-resolution imaging along with high sensitivity and high spatial resolution analysis at even faster speeds.

JSM-IT100 InTouchScope™ Scanning Electron Microscope
Mã sản phẩm: S000100
Đăng ngày 27-03-2019 02:23:15 AM

The JSM-IT100, equipped with 50 years of JEOL SEM technologies, is a compact, versatile scanning electron microscope. Ease of use is a key feature of our successful InTouchScope series while maintaining the versatility and expandability expected from a research-grade SEM. This all-in-one SEM is used in a wide range of fields, such as biotechnology and nanotechnology, covering various applications, from materials development, testing, evaluation, and defect analysis to quality control, etc.

JCM-6000Plus Versatile Benchtop SEM
Mã sản phẩm: S000099
Đăng ngày 27-03-2019 02:22:13 AM

Benchtop Scanning Electron Microscope. Intuitive operation is achieved via touch panel and new operation screens. The low vacuum mode is included in the standard configuration, and EDS can be installed, offering a truly multi-functional benchtop SEM

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