2D Micro-XRF with Ultimate Speed and Accuracy 2D Micro-XRF with Ultimate Speed and Accuracy

M4 TORNADO is the tool of choice for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) for information on composition and element distribution. Optimized for analysis speed and without compromising accuracy it measures a wide range of samples. Whether small or large, even or irregularly shaped — equipped with a large high-speed stage it supports 2D analysis of virtually any kind of inorganic, organic ,and even of liquid sample. Its large vacuum chamber enables light element detection.

 

M4 TORNADO now features an optional 60 mm2 XFlash® SD detector for ultra high-speed spectra acquisition with up to 50% higher element sensitivity, compared to the standard 30 mm² active detector area, and significantly improves the measurement efficiency when using primary filters or analyzing light element samples.  This new option is ideally suited for geology and other low yield applications, the analysis of thin samples, and low kV or tube current conditions. The 60 mm² XFlash® SDD is also available as a dual detector system which doubles sensitivity and throughput.

 

M4 TORNADO provides excellent spatial resolution with spot sizes down to 20 µm for Mo Kα radiation. The new FlexiSpot feature allows to optionally chose a larger spot size of up to 200 µm for improved reproducible quantification of irregularly shaped samples, such as powders, soils or granular raw materials.

The M4 TORNADO analysis software 1.5 provides a flexible measurement setup and a variety of evaluation and processing tools. The new XMethod module makes it easy to manage calibrations and standards and enables the user to develop and optimize analytical methods for complex applications, such as quantitative analysis of metallic multilayer stacks for composition and coating thickness.

The M4 TORNADO can be customized to provide extended measurement ranges or even higher analysis speed: flexibility can be enhanced through installation of a second tube with a different target and a collimator. An optional second SD detector increases speed even further.

S000067 Micro X-Ray Fluorescence – Coating Thikness And Rohs Application Số lượng: 0 đôi


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  • 2D Micro-XRF with Ultimate Speed and Accuracy

  • Đăng ngày 27-03-2019 10:02:31 AM - 4200 Lượt xem
  • Mã sản phẩm: S000067
  • M4 TORNADO is the tool of choice for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) for information on composition and element distribution. Optimized for analysis speed and without compromising accuracy it measures a wide range of samples. Whether small or large, even or irregularly shaped — equipped with a large high-speed stage it supports 2D analysis of virtually any kind of inorganic, organic ,and even of liquid sample. Its large vacuum chamber enables light element detection.

     

    M4 TORNADO now features an optional 60 mm2 XFlash® SD detector for ultra high-speed spectra acquisition with up to 50% higher element sensitivity, compared to the standard 30 mm² active detector area, and significantly improves the measurement efficiency when using primary filters or analyzing light element samples.  This new option is ideally suited for geology and other low yield applications, the analysis of thin samples, and low kV or tube current conditions. The 60 mm² XFlash® SDD is also available as a dual detector system which doubles sensitivity and throughput.

     

    M4 TORNADO provides excellent spatial resolution with spot sizes down to 20 µm for Mo Kα radiation. The new FlexiSpot feature allows to optionally chose a larger spot size of up to 200 µm for improved reproducible quantification of irregularly shaped samples, such as powders, soils or granular raw materials.

    The M4 TORNADO analysis software 1.5 provides a flexible measurement setup and a variety of evaluation and processing tools. The new XMethod module makes it easy to manage calibrations and standards and enables the user to develop and optimize analytical methods for complex applications, such as quantitative analysis of metallic multilayer stacks for composition and coating thickness.

    The M4 TORNADO can be customized to provide extended measurement ranges or even higher analysis speed: flexibility can be enhanced through installation of a second tube with a different target and a collimator. An optional second SD detector increases speed even further.


Số lượng

he M4 TORNADO combines state-of-the-art X-ray generation and detection technology with an unique usability concept, resulting in a powerful, yet easy-to-use instrument for non-destructive element analysis:


SpotSize

Polycapillary X-ray optics focus the tube radiation to smallest areas, generating spots of highest radiation brilliance on the sample surface down to 20 µm diameter for Mo K radiation. More info


XFlash Technology

The XFlash® silicon drift X-ray detector technology is the key to the instrument's outstanding performance, providing excellent energy resolution at highest count rates. More info


Dual Detector

The standard version of the M4 TORNADO is equipped with a single high performance XFlash® detector. Optionally it can be fitted with a second detector for even higher speed and additional analytical possibilities. More info


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The M4 TORNADO is equipped with a single rhodium target X-ray tube. Additional analytical flexibility can be attained by adding a second tube with a different target material or a collimator instead of polycapillary optics. More info


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The TurboSpeed X-Y-Z stage supports analysis "on the fly". Defining areas for measurement is aided by a dual video microscope with variable magnifications. An additional fish-eye camera provides a view of the sample chamber.

The motorized sample chamber door opens at a push of a button. The stage is at the same time automatically moved to the front where samples can be exchanged easily without having to reach inside the chamber.


M-Quant

The powerful ESPRIT software of the M4 TORNADO uses an advanced Fundamental Parameter based approach for quantification. More info

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