NGOC MINH ISE CO.,LTD.

Chroma 19501-K Partial Discharge Tester combines Hipot test and PD (Partial Discharge) detector functions in one instrument. The device is capable of a maximum 10kV AC output with leakage current measurement range of 0.01uA to 300uA and a minimum Partial Discharge detection of 1pC. The tester is specifically developed to test high voltage semiconductor components and high insulation materials. The 19501-K design meets the IEC 60270-1 and IEC 60747-5-5 standards, and has built-in IEC 60747-5-5 test methods for use. It not only satisfies the production test requirements for opto-coupler products, but also gives users a friendly and convenient operation interface. 

The Chroma 19311 series Battery Cell Surge Tester is designed for testing the insulation quality between the positive and negative plates of the lead-acid battery cell. This is done by applying a high voltage surge/impulse before the electrolyte injection. Its output voltage can reach up to 6kV. It also has four terminal measurement and 200MHz sampling rate. The Chroma 19311 series has single channel (19311) and multi-channel (19311-10) tester.

Key Features：

• Open architecture software
  • Expandable hardware support
  • Support instruments equipped with GPIB/RS232 or RS485 interface
  • User editable test library (test Items)
  • User editable test programs
  • Statistical report
  • User privilege control
  • Test item/ Program Release control
  • Activity log
  • Support Barcode reader
• Test command editor helps to improve test speed
• Comprehensive hardware modules provide highly accurate, repetitive measurements
• High test throughput by system test items
• High test throughput generated by system test items
• Cost effective
• Hardware expandable upon request
• Windows ® 2000/ XP based software

* Test items can be customized or created via the test item editor based on the requirements of various UUTs.

Key Features：

• Support component test scanning
• Support 8 slots for plug-in (removable), up to 320 channels for one unit
• Option A130007 40 channels scan module, input up to 500VDC for IR test without switching
• Max. 8 salve units for multiple scanner (master/slave interface)
• Support Chroma LCR meter
• Support Chroma 3302/3252/11025 turn ration function
• Support 11200 CLC/IR meter for IR test
• Standard RS-232, GPIB and USB interface
• 13001 can be installed in Chroma Component ATE model 8800
• Support ICT applications

Key Features：

• Basic accuracy : 0.05%
• Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurement
• DC test current output mode is used to fasten measurement speed for inductive DUT
• Dry-circuit test current output mode (limited Max. 20mV) is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 50mV
• Temperature correction (TC function) regardless of material or temperature
• Useful temperature conversion function for motor/ coil evaluation
• 4 channels R scan with balance check function for fan motor (combined with A165017 option)
• 0.001mΩ~1.9999MΩ wide measurement range with 4½ digits resolution
• Standard RS-232 interface
• Optional GPIB & Handler interface
• Bin-sorting function
• Comparator and pass/fail alarming beeper function
• Large LCD display (240 x 64 dot-matrix)
• Friendly user interface
• LabView^® Driver

Key Features：

Programmable HF AC Tester Model 11802/11803/11805 
HF Hipot Tester Model 11890 
HF HV Load Life Tester Model 11891

• HF HV Load Life Test (CV and CC mode)
• HF Withstand Voltage Test (CV and CC mode)
• HF Breakdown Voltage Test (CV mode)
• Test frequency: 20kHz ~1MHz
• Wide output voltage and current range while combine with different module (Module is customized and based on the tester's power)
• Output voltage and current monitor
• Programmable output voltage waveform control
• Cycle count mode or time count mode for load life test timer
• Lower power consumption and lower temperature rising design
• Large LCD display (320 x 240 dot-matrix)
• Built-in digital timer

Key Features：

• C meter provides Z/C/D/Q/ESR parameters for test
• Available 7 test frequencies from 100~100kHz for selection
• 0.1% basic measurement accuracy
• The thin-film withstand voltage results can be displayed in graph by converting them to an actual rising curve
• CPK calculation function for 1000 capacitor test results that is convenient for analyzing the production capability
• 320 x 240 dot-matrix LCD display
• 200 sets of internal memories and 4M SRAM interface card for saving and recalling the parameter settings
• Designed for100mΩ range with accuracy measurement up to 0.1mΩ
• Non-Relay switch is built in. It is safe and reliable as the discharge circuit is close to the fixed power
• Perform electric polarity test before charge to avoid the danger of explosion
• Softpanel for leakage current data statistics analysis
• Equipped with RS-232, printer and scanner controller interfaces
• Meet the test regulation of EIAJ RC-2364A
• A131001 scan box has four terminals designed for measuring accurate high frequency and low impedance

Key Features：

• Test Parameter: L/C/R/Z/Y/DCR/Q/D/ θ
• Test Frequency: 
  75kHZ~30MHz (11050-30M)
  1kHz~10MHz (11050)
  60Hz~5MHz (11050-5M) 
• Test Level: 10mV ~ 5V
• Basic Accuracy: 0.1%
• 7ms fast speed measurement
• 3 output impedance modes
• Test signal monitoring function
• Compare & bin-sorting function
• Open/short zeroing & load correction function
• Detached measurement & display unit design
• Standard Handler, RS-232C, USB storage & external bias current control interface
• Optional GPIB or LAN interfac