SNE-3000MS

Số lượng

5nm

Resolution

60,000x

Magnification

SE Image

SE Detector

The most appropriate Table-top SEM for the surface inspection with 10,000x of magnification which is main inspection range by SEM

Entry-level Table-top SEM with 15nm resolution & 60,000x magnification

SE (Secondary Electron)

¢¹ Create images with the height level information. Mostly used for surface inspection

Convenience

Stage System

X,Y,R (3-axis)

Beam Shift: 150¥ìm

Auto Setting

Focus, Contrast, Brightness

Simple S/W

Convenient Operation

Convenient stage movement by 3-axis and able to operate easily and conveniently with mouse control in U.I

Able to get various analysis results with various scan modes measurement tool

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Sản phẩm cùng loại

S000209

S000208

S000207

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