Slotted Micro-XRF Spectrometer Slotted Micro-XRF Spectrometer
Designed for the Analysis of Bulk Materials and Coatings
This small-spot X-ray fluorescence (XRF) spectrometer is specifically designed for the nondestructive analysis of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. The slotted sample chamber and the large tray support fast and exact positioning of all types of PCBs from small to oversized that extend the sample chamber. Its rugged construction allows the M2 BLIZZARD to be used on the shop floor.
The M2 BLIZZARD is equipped with a high-performance silicon drift detector which is suitable for the analysis of thinner layers and unknowns as well as for routine analysis. The powerful video microscope system provides an auto focus function. Ease-of-use is further enhanced by software support of an optional industrial-strength foot switch and touchscreen operation.

Equipped with the latest version of Bruker’s XSpect Pro and XData software packages, the M2 BLIZZARD is particularly attractive for the analysis of metal multilayers that are common to PCBs. Layer systems consisting of up to 12 layers with up to 25 elements each can be characterized with regard to composition and thickness.

 
Experienced supervisors can use the configurability of the software to define measurement methods fine-tuned to the samples to be analyzed. These methods can then be routinely used by staff at the production site to perform the actual analyses for quality control. Setting up and performing these analyses is intuitive so that introductory training of staff is sufficient. The PASS/FAIL determination of the software or trend line display with upper and lower control limits lets the operator see immediately whether a sample is of acceptable quality or not. Reporting and data archiving functions are included as well and data can be exported to Excel®.
 S000055 Micro x-ray fluorescence – coating thikness and rohs application Quantity: 0 đôi

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  • Slotted Micro-XRF Spectrometer

  • Post on 26-03-2019 09:03:33 PM - 3043 Views

  • Designed for the Analysis of Bulk Materials and Coatings
    This small-spot X-ray fluorescence (XRF) spectrometer is specifically designed for the nondestructive analysis of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. The slotted sample chamber and the large tray support fast and exact positioning of all types of PCBs from small to oversized that extend the sample chamber. Its rugged construction allows the M2 BLIZZARD to be used on the shop floor.
    The M2 BLIZZARD is equipped with a high-performance silicon drift detector which is suitable for the analysis of thinner layers and unknowns as well as for routine analysis. The powerful video microscope system provides an auto focus function. Ease-of-use is further enhanced by software support of an optional industrial-strength foot switch and touchscreen operation.

    Equipped with the latest version of Bruker’s XSpect Pro and XData software packages, the M2 BLIZZARD is particularly attractive for the analysis of metal multilayers that are common to PCBs. Layer systems consisting of up to 12 layers with up to 25 elements each can be characterized with regard to composition and thickness.

     
    Experienced supervisors can use the configurability of the software to define measurement methods fine-tuned to the samples to be analyzed. These methods can then be routinely used by staff at the production site to perform the actual analyses for quality control. Setting up and performing these analyses is intuitive so that introductory training of staff is sufficient. The PASS/FAIL determination of the software or trend line display with upper and lower control limits lets the operator see immediately whether a sample is of acceptable quality or not. Reporting and data archiving functions are included as well and data can be exported to Excel®.

Reliable Results in PCB Analysis

A rugged instrument for shop floor and QC lab operation


M2 BLIZZARD with PCB and Monitor
M2 BLIZZARD with monitor, the 
instrument for PCB coating analysis

Bruker‘s M2 BLIZZARD is a small spot X-ray fluorescence spectrometer with the main purpose of nondestructive analysis of printed circuit boards. The slotted instrument permits safe investigation of large and small samples. The powerful
XSpect Pro software supports the compositional analysis of bulk and layer samples and the accurate determination of multilayer thickness in compliance with the ASTM B568 and DIN/ISO 3497 standards.

The M2 BLIZZARD features

  • ƒƒCost efficient operation
  • ƒƒRobustness and freedom of maintenance
  • ƒƒEase of use
  • ƒƒAdvanced user safety
  • ƒƒAnalytical flexibility
  • ƒƒFast and accurate analysis
  • ƒA powerful software package

Cost efficient to operate

The M2 BLIZZARD is a measurement device with low power consumption that requires no consumables.

 

Robust and maintenance-free

The system is designed for reliable use in a production environment. All moving parts and measurement head are completely inside the encasement and protected from contact.

Easy to use

The M2 BLIZZARD can be operated by staff that has received introductory training only. The user-friendly software can be set up to perform all measurements automatically. Autofocus and measurement can also be initiated by foot switch or touchscreen operation. Samples are positioned by means of a plastic tray and the measurement spot can be accurately determined using the built-in video microscope.

 

Advanced safety features

The enclosure of the M2 BLIZZARD provides optimal radiation protection. Using the plastic tray to move samples in and out of measurement position is an additional safety feature.

Analytical flexibility

Both bulk samples and layer systems can be analyzed with the M2 BLIZZARD. Bulk sample analysis uses a standard-based model. Layer analysis can be done with a Fundamental Parameter model that can be refined further by using standards.

 

Speed, accuracy and precision in analysis

Excitation with a high-performance micro-focus tube and collection of fluorescence radiation with an efficient silicon drift detector result in short measurement times and provide accurate concentrations down to trace levels.  The stability of the systems warrants precision and comparability of results over longer times.

Powerful system software

The M2 BLIZZARD features XSpect Pro and XSpect Data for analytical standards management, measurement setup, analytical method (application) design, analysis, reporting and data archiving.

     

 Keyword: designed for, the analysis, of bulk, materials and, coatingsthis small-spot, x-ray fluorescence, xrf spectrometer, is specifically, the nondestructive, analysis of, printed circuit, boards pcb, in accordance, with astm, b568 and, din/iso 3497
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