M4 Tornado Plus
Post on 27-03-2019 11:45:24 AM

A New Era in Micro-XRF

M4 TORNADOPLUS is the world's first Micro-XRF spectrometer that enables the detection and analysis of the entire element range from carbon to americium. As the latest member of the proven, market leading family of M4 TORNADO Micro-XRF analyzers, the M4 TORNADOPLUS also offers additional unique features, such as an innovative aperture management system, an ultra-high throughput pulse processor and a flexible quick-change sample stage.

2D Micro-XRF with Ultimate Speed and Accuracy
Post on 27-03-2019 11:02:31 AM

M4 TORNADO is the tool of choice for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) for information on composition and element distribution. Optimized for analysis speed and without compromising accuracy it measures a wide range of samples. Whether small or large, even or irregularly shaped — equipped with a large high-speed stage it supports 2D analysis of virtually any kind of inorganic, organic ,and even of liquid sample. Its large vacuum chamber enables light element detection.

 

M4 TORNADO now features an optional 60 mm2 XFlash® SD detector for ultra high-speed spectra acquisition with up to 50% higher element sensitivity, compared to the standard 30 mm² active detector area, and significantly improves the measurement efficiency when using primary filters or analyzing light element samples.  This new option is ideally suited for geology and other low yield applications, the analysis of thin samples, and low kV or tube current conditions. The 60 mm² XFlash® SDD is also available as a dual detector system which doubles sensitivity and throughput.

 

M4 TORNADO provides excellent spatial resolution with spot sizes down to 20 µm for Mo Kα radiation. The new FlexiSpot feature allows to optionally chose a larger spot size of up to 200 µm for improved reproducible quantification of irregularly shaped samples, such as powders, soils or granular raw materials.

The M4 TORNADO analysis software 1.5 provides a flexible measurement setup and a variety of evaluation and processing tools. The new XMethod module makes it easy to manage calibrations and standards and enables the user to develop and optimize analytical methods for complex applications, such as quantitative analysis of metallic multilayer stacks for composition and coating thickness.

The M4 TORNADO can be customized to provide extended measurement ranges or even higher analysis speed: flexibility can be enhanced through installation of a second tube with a different target and a collimator. An optional second SD detector increases speed even further.

Slotted Micro-XRF Spectrometer
Post on 26-03-2019 10:03:33 PM

Designed for the Analysis of Bulk Materials and Coatings
This small-spot X-ray fluorescence (XRF) spectrometer is specifically designed for the nondestructive analysis of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. The slotted sample chamber and the large tray support fast and exact positioning of all types of PCBs from small to oversized that extend the sample chamber. Its rugged construction allows the M2 BLIZZARD to be used on the shop floor.
The M2 BLIZZARD is equipped with a high-performance silicon drift detector which is suitable for the analysis of thinner layers and unknowns as well as for routine analysis. The powerful video microscope system provides an auto focus function. Ease-of-use is further enhanced by software support of an optional industrial-strength foot switch and touchscreen operation.

Equipped with the latest version of Bruker’s XSpect Pro and XData software packages, the M2 BLIZZARD is particularly attractive for the analysis of metal multilayers that are common to PCBs. Layer systems consisting of up to 12 layers with up to 25 elements each can be characterized with regard to composition and thickness.

 
Experienced supervisors can use the configurability of the software to define measurement methods fine-tuned to the samples to be analyzed. These methods can then be routinely used by staff at the production site to perform the actual analyses for quality control. Setting up and performing these analyses is intuitive so that introductory training of staff is sufficient. The PASS/FAIL determination of the software or trend line display with upper and lower control limits lets the operator see immediately whether a sample is of acceptable quality or not. Reporting and data archiving functions are included as well and data can be exported to Excel®.

Compact Tabletop Micro-XRF Spectrometer
Post on 26-03-2019 10:01:19 PM

Designed for the Analysis of Bulk Materials and Coatings

The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings. Designed for fast and cost-efficient operation it provides accurate information on the elemental composition of materials.

The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and even more important – nondestructively. Samples sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even more comfort.

NGOC MINH ISE CO.,LTD
- HCMC Office: Block A, Lever 2, Linh Trung Building, No 6-8, Road no 16, Linh Trung Ward, Thu Duc District, HCMC.
- Head Quaters: 427 Le Dai Hanh, Ward 11, District 11, HCM City.
- Phone: +84-28-66865303  
- Mobile: +84 982 427 168
- Email: dung@ngocminh-ise.com
- Website: http://ngocminh-ise.com
 
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