NGOC MINH ISE CO., LTD

The standard of Table-top SEM,

SNE-3000MS

Energy Dispersive X-Ray Spectrometer (EDS)

Model: XFlash®  630H

Manufacturers: Bruker

Detector: LN2-free high-speed SDD Detector

Chip Size: 30 mm2

Element Detector Range: Boron(5) ~ Americium(95) 

Spectrum Resolution: Less than 129eV (Standard: MnKα)

Ion Suptter Coater 

Model: MCM-100

Manufacturer: SEC – Korea

Tabletop SEM

Model: SNE-4500 Plus

Manufacturers: SEC – Korea

Scanning Electron Microscopy (SEM) is used for various ingredient analysis and surface structure analysis through several detectors after focusing and detecting secondary electron emitted from sample by shooting electron beam on the sample in the chamber. SEM is the foundation technique of MEMS(Microelectromechanical systems) industry and an equipment for analysis and measurement of ultrafine nano structure having resolution of 1nm.