Super Light Element Detection - seeing down to carbon

Using two large-area silicon drift detectors with super light element window and a specifically optimized Rh X-ray tube, the M4 TORNADO^PLUS is the first Micro-XRF spectrometer ever to enable the analysis of light elements. Unlike common Micro-XRF systems, which are suitable to detect elements from sodium up, the M4 TORNADO^PLUS allows to also measure elements with atomic numbers Z<11, such as fluorine, oxygen, nitrogen and carbon, without compromising the performance and sensitivity in the higher energy ranges. With this performance enhancement, new applications are opening up for Micro-XRF, e.g. in geoscience and mining, biology, polymer research or semiconductor industry.

Twice the Throughput - for faster measurements

Already the previous dual detector versions of the M4 TORNADO have been trendsetting in this regard, providing up to 260 kcps output count rate with excellent energy resolution. With its unique ability to process up to 1,200 kcps and to deliver an output count rate of up to 550 kcps, the M4 TORNADO^PLUS pushes these limits significantly further, enabling unmatched acquisition speed and productivity.

Aperture Management System (AMS) - for better depth of field and resolution

Many specimens to be investigated using Micro-XRF have topographic surfaces, rather than being perfectly flat. Therefore, just like in photography, the depth of field becomes an important parameter for the X-ray optical system used to generate the small excitation spot on the sample surface. Usually, in Micro-XRF analyzers with high spatial resolution X-ray optics (7 µm), the working distance needs to be as small as 2 µm and the achievable depth of filed is less than 1 mm.

The innovative, software-controlled aperture management system (AMS) of the M4 TORNADO^PLUS enables a working distance of approx. 9 mm and provides a depth of field of up to approx. 5 mm. That means, the spatial resolution does not get lost, and sample features are kept in focus, even if the sample surface varies over several millimeters. This makes the M4 TORNADO^PLUS the instrument of choice for the analysis of specimens with strong topography, e.g. in electronics, forensics, or geoscience.

Quick Sample Exchange - for easier, quicker and more secure sample handling

The M4 TORNADO^PLUS also offers a quick-change stage interface and optional special drill core and thin section carriers. These accessories allow the specimens to be placed and fixed quickly and securely onto a removable stage plate and make it easy to attach or exchange specimens for a faster and more secure analysis as well as reanalysis. This saves time both in specimen exchange as well as in measurement set-up, as the specimens will always be at the same height and position.

M4 TORNADO PLUS: Super Light Element Micro-XRF Spectrometer

Second X-ray Tube Collimator Changer - more flexibility when analyzing high-energy lines

The optional second fine focus X-ray tube of the new M4 TORNADO^PLUS is equipped with a fully software controlled four-position collimator changer, expanding the flexibility of the spot size from 500 µm to 4.5 mm. This allows either a small collimated spot albeit with lower intensity, or a large high intensity spor for close to common XRF analysis. The result is more flexibility when analyzing larger structures or working with high-energy X-ray lines.

Multi-Functional Computer-Controlled He-Purge - analyze light elements without vacuum

For certain specimens, measurement under vacuum poses an issue because they are sensitive to pressure variation or may dry out. Even though working at ambient air is always possible, X-ray fluorescence from the light elements below Ca is strongly attenuated or even completely absorbed. In order to detect light and super light elements down to carbon also in vacuum-sensitive samples, the M4 TORNADO^PLUS offers an optional, computer-controlled He-purge system to extend the analysis range under atmospheric pressure. Two different purging modes can be employed, depending on the specific analytical requirements. For a quick single or multi-point analysis, local high-flow purging of the measurement position is sufficient to reliably acquire the low energy X-rays.
 

Technical Specifications