NGOC MINH ISE CO., LTD

Key Features：

• Open architecture software
  • Expandable hardware support
  • Support instruments equipped with GPIB/RS232 or RS485 interface
  • User editable test library (test Items)
  • User editable test programs
  • Statistical report
  • User privilege control
  • Test item/ Program Release control
  • Activity log
  • Support Barcode reader
• Test command editor helps to improve test speed
• Comprehensive hardware modules provide highly accurate, repetitive measurements
• High test throughput by system test items
• High test throughput generated by system test items
• Cost effective
• Hardware expandable upon request
• Windows ® 2000/ XP based software

* Test items can be customized or created via the test item editor based on the requirements of various UUTs.

Key Features：

• Support component test scanning
• Support 8 slots for plug-in (removable), up to 320 channels for one unit
• Option A130007 40 channels scan module, input up to 500VDC for IR test without switching
• Max. 8 salve units for multiple scanner (master/slave interface)
• Support Chroma LCR meter
• Support Chroma 3302/3252/11025 turn ration function
• Support 11200 CLC/IR meter for IR test
• Standard RS-232, GPIB and USB interface
• 13001 can be installed in Chroma Component ATE model 8800
• Support ICT applications

Key Features：

• Basic accuracy : 0.05%
• Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurement
• DC test current output mode is used to fasten measurement speed for inductive DUT
• Dry-circuit test current output mode (limited Max. 20mV) is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 50mV
• Temperature correction (TC function) regardless of material or temperature
• Useful temperature conversion function for motor/ coil evaluation
• 4 channels R scan with balance check function for fan motor (combined with A165017 option)
• 0.001mΩ~1.9999MΩ wide measurement range with 4½ digits resolution
• Standard RS-232 interface
• Optional GPIB & Handler interface
• Bin-sorting function
• Comparator and pass/fail alarming beeper function
• Large LCD display (240 x 64 dot-matrix)
• Friendly user interface
• LabView^® Driver

Key Features：

Programmable HF AC Tester Model 11802/11803/11805 
HF Hipot Tester Model 11890 
HF HV Load Life Tester Model 11891

• HF HV Load Life Test (CV and CC mode)
• HF Withstand Voltage Test (CV and CC mode)
• HF Breakdown Voltage Test (CV mode)
• Test frequency: 20kHz ~1MHz
• Wide output voltage and current range while combine with different module (Module is customized and based on the tester's power)
• Output voltage and current monitor
• Programmable output voltage waveform control
• Cycle count mode or time count mode for load life test timer
• Lower power consumption and lower temperature rising design
• Large LCD display (320 x 240 dot-matrix)
• Built-in digital timer

Key Features：

• C meter provides Z/C/D/Q/ESR parameters for test
• Available 7 test frequencies from 100~100kHz for selection
• 0.1% basic measurement accuracy
• The thin-film withstand voltage results can be displayed in graph by converting them to an actual rising curve
• CPK calculation function for 1000 capacitor test results that is convenient for analyzing the production capability
• 320 x 240 dot-matrix LCD display
• 200 sets of internal memories and 4M SRAM interface card for saving and recalling the parameter settings
• Designed for100mΩ range with accuracy measurement up to 0.1mΩ
• Non-Relay switch is built in. It is safe and reliable as the discharge circuit is close to the fixed power
• Perform electric polarity test before charge to avoid the danger of explosion
• Softpanel for leakage current data statistics analysis
• Equipped with RS-232, printer and scanner controller interfaces
• Meet the test regulation of EIAJ RC-2364A
• A131001 scan box has four terminals designed for measuring accurate high frequency and low impedance

Key Features：

• Test Parameter: L/C/R/Z/Y/DCR/Q/D/ θ
• Test Frequency: 
  75kHZ~30MHz (11050-30M)
  1kHz~10MHz (11050)
  60Hz~5MHz (11050-5M) 
• Test Level: 10mV ~ 5V
• Basic Accuracy: 0.1%
• 7ms fast speed measurement
• 3 output impedance modes
• Test signal monitoring function
• Compare & bin-sorting function
• Open/short zeroing & load correction function
• Detached measurement & display unit design
• Standard Handler, RS-232C, USB storage & external bias current control interface
• Optional GPIB or LAN interfac