JSM-IT100 InTouchScope™ Scanning Electron Microscope JSM-IT100 InTouchScope™ Scanning Electron Microscope The JSM-IT100, equipped with 50 years of JEOL SEM technologies, is a compact, versatile scanning electron microscope. Ease of use is a key feature of our successful InTouchScope series while maintaining the versatility and expandability expected from a research-grade SEM. This all-in-one SEM is used in a wide range of fields, such as biotechnology and nanotechnology, covering various applications, from materials development, testing, evaluation, and defect analysis to quality control, etc. S000100 JEOL Quantity: 0 đôi


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  • JSM-IT100 InTouchScope™ Scanning Electron Microscope

  • Post on 27-03-2019 01:23:15 PM - 508 Views
  • The JSM-IT100, equipped with 50 years of JEOL SEM technologies, is a compact, versatile scanning electron microscope. Ease of use is a key feature of our successful InTouchScope series while maintaining the versatility and expandability expected from a research-grade SEM. This all-in-one SEM is used in a wide range of fields, such as biotechnology and nanotechnology, covering various applications, from materials development, testing, evaluation, and defect analysis to quality control, etc.


The JSM-IT100, equipped with 50 years of JEOL SEM technologies, is a compact, versatile scanning electron microscope. 
Ease of use is a key feature of our successful InTouchScope™ series while maintaining the versatility and expandability expected from a research-grade SEM. This all-in-one SEM is used in a wide range of fields, such as biotechnology and nanotechnology, covering various applications, from materials development, testing, evaluation, and defect analysis to quality control, etc. 
With an EDS-embedded model, an easy-to-use software system enables smooth integration of observation, elemental analysis and report generation.
The InTouchScope™ series has been the choice of customers around the world since its release in 2010, with the total number of units shipped exceeded 1,000 before.

 

Superior Operability

  • The Touch panel enables comfortable and intuitive operation.
  • Operations with the operation panel* and mouse are also allowed, thus extending selection of the operations according to the purpose of users.

An easy-to-use software interface allows even inexperienced users to accomplish any task with high efficiency

  • The JSM-IT100 incorporates a GUI that fully integrates observation to element analysis in one window while SEM/EDS switching can be made with one-click setting. This easy-to-use software interface allows even inexperienced users to accomplish any task with high efficiency.
  • Perform specimen exchange smoothly by pressing the buttons as indicated by the specimen exchange navigation.
  • When the motor-drive stage* and stage navigation system* are installed, it is possible to locate a region of interest with the feel of operating an optical microscope.
  • Installation of the EDS guide ensures that analysis can be performed without any indecision.

The new all-in-one SEM can be equipped with the same options as high-end instruments

  • Besides low-vacuum mode, even non-conductive materials without any pre-treatment can be imaging and analysing.
  • In addition to low-vacuum observation and element analysis, the JSM-IT100 accommodates a 5-axis motor drive stage.* An option to extend the accelerating voltage up to 30 kV is also available*

Expanded EDS functions are now included such as: area analysis and line scans

  • The JSM-IT100 is equipped with a JEOL-made EDS and achieves a fully-integrated GUI that allows SEM/EDS switching in one window.
  • EDS functions in the award-winning InTouchScope™ series are further strengthened by adding partial area analysis, line scan analysis and mapping filter functions.

Space-saving and easy installation

  • The JSM-IT100 has a footprint 30% smaller than our predecessors, requiring only about the same space as a benchtop scanning electron microscope.
  • A 100V power outlet is sufficient for installation and no cooling water is needed, which considerably increases flexibility at the installation site.

* Option

     

 

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